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Advanced Production Testing of RF, SoC, and SiP Devices

ISBN13: 9781580537094
ISBN: 158053709X
Binding: Hardcover
List Price: $99.0
Publisher: Artech House Publishers
Published Date:
Edition 1
Pages: 326
Average Goodreads rating: 2.00/5 (1 ratings)

Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before.