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Michael T. Postek

1. Critical Issues in Scanning Electron Microscope Metrology: September-October 1994

ISBN: 0788115529
ISBN13: 9780788115523
Binding: Paperback
List Price: $20.0
Publisher: Diane Pub Co
Published Date: 06/01/1994

2. Integrated Circuit Metrology, Inspection, and Process Control VI: 9-11 March 1992 San Jose, California

Editor: Michael T. Postek

ISBN: 081940828X
ISBN13: 9780819408280
Binding: Paperback
List Price: $94.0
Publisher: Society of Photo Optical
Published Date: 05/01/1992

3. Nanostructure Science, Metrology, and Technology

Author: Martin Charles Peckerar - Editor: Michael T. Postek

ISBN: 0819443476
ISBN13: 9780819443472
Binding: Paperback
List Price: $80.0
Publisher: Society of Photo Optical
Published Date: 07/24/2002

4. Instrumentation, Metrology, and Standards for Nanomanufacturing II

Editor: Michael T. Postek - Editor: John A. Allgair

ISBN: 081947262X
ISBN13: 9780819472625
Binding: Paperback
List Price: $60.0
Publisher: Society of Photo Optical
Published Date: 08/28/2008

5. Instrumentation, Metrology, and Standards for Nanomanufacturing

Editor: John A. Allgair - Editor: Michael T. Postek

ISBN: 0819467960
ISBN13: 9780819467966
Binding: Paperback
List Price: $80.0
Publisher: Society of Photo Optical
Published Date: 09/10/2007

6. Microlithography and Metrology in Micromachining 23 24 October 1995: 23-24 October, 1995, Austin, Texas

Author: Society of Photo-Optical Instrumentation Engineers - Author: National Institute of Standards and Technology (U.S.) - Author: Michael T. Postek - Author: Semiconductor Equipment and Materials Institute - E :

ISBN: 0819420069
ISBN13: 9780819420060
Binding: Paperback
List Price: $66.0
Publisher: Society of Photo Optical
Published Date: 09/01/1995

7. Scanning Microscopy 2009

Editor: Dale E. Newbury - Editor: S. Frank Platek - Editor: Michael T. Postek - Editor: David C. Joy

ISBN: 0819476544
ISBN13: 9780819476548
Binding: Paperback
List Price: $140.0
Publisher: Society of Photo Optical
Published Date: 06/18/2009