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    • TOP > TECHNOLOGY > Electronics : Circuits : General > Very high speed integrated circuits

    Pages:  1 

    1. 1999 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
    0780344421 - CD-ROM - List Price: $128.00
    Author: IEEE Electron Devices
    Author: IEEE Electron Devices Society

    2. 1999 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
    0780356047 - Paperback - List Price: $128.00
    Author: Cal IEEE Radio Frequency Integrated Circuits Symposium (1999 Anaheim
    Author: IEEE Electron Devices Society

    3. CMOS RF Modeling, Characterization and Applications
    9810249055 - Book - List Price: $86.00
    Author: Tor A. Fjeldly
    Editor: M. Jamal Deen

    4. Gigahertz Devices and Systems
    081943454X - Book - List Price: $62.00
    Author: Society of Photo-Optical Instrumentation Engineers
    Editor: Dwight C. Streit

    5. High Performance Memories
    0471986100 - Book - List Price: $145.00
    Author: Betty Prince

    6. High-Speed Heterostructure Devices
    0521781523 - Book - List Price: $85.00
    Author: Patrick Roblin
    Author: Hans Rohdin

    7. High-Speed Integrated Circuit Technology
    9810246382 - Book - List Price: $88.00
    Editor: Mark J. W. Rodwell

    8. Radio Frequency Integrated Circuit Design
    158053502X - Book - List Price: $119.00
    Author: John W. M. Rogers
    Author: Calvin Plett

    9. RF and Microwave Semiconductor Device Handbook
    084931562X - Book - List Price: $99.95
    Editor: John Michael Golio

    10. RF CMOS Power Amplifiers
    0792376285 - Book - List Price: $115.50
    Author: Mona Mostafa Hella
    Author: Mohammed Ismail

    11. RF MEMS
    0471201693 - Hardcover - List Price: $89.95
    Author: Gabriel M. Rebeiz

    12. Ultrafast Electronics and Optoelectronics Proceedings 1997
    1557524866 - Paperback - List Price: $75.00
    Author: John E. Bowers
    Author: Topical Meeting on Ultrafast Electronics and Optoelectronics (1997 In
    Author: Martin Nuss
    Author: Optical Society of America
    Editor: Martin C. Nuss
    Editor: John Bowers

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