AddALL book price comparison

1. Metrology, Inspection, and Process Control for Microlithography XII

ISBN: 0819427772
ISBN13: 9780819427779
Binding: Paperback
List Price: $140.0
Publisher: Society of Photo Optical
Published Date: 06/01/1998

2. Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components

Author: Angela Duparre - Editor: Bhanwar Singh

ISBN: 0819445460
ISBN13: 9780819445469
Binding: Paperback
List Price: $80.0
Publisher: Society of Photo Optical
Published Date: 11/11/2002

3. Advanced Characterization Techiniques for Optics, Semiconductors, and Nanotechnologies: 3-5 August 2003 San Diego, California, USA

Editor: Angela Duparre - Editor: Bhanwar Singh

ISBN: 0819450618
ISBN13: 9780819450616
Binding: Paperback
List Price: $90.0
Publisher: Society of Photo Optical
Published Date: 11/01/2003

4. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II

Author: Angela Duparre - Editor: Bhanwar Singh - Editor: Zu-Han Gu

ISBN: 081945883X
ISBN13: 9780819458834
Binding: Paperback
List Price: $105.0
Publisher: Society of Photo Optical
Published Date: 08/18/2005

5. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III

Editor: Bhanwar Singh - Editor: Angela Duparre - Editor: Zu-Han Gu

ISBN: 0819468207
ISBN13: 9780819468208
Binding: Paperback
List Price: $80.0
Publisher: Society of Photo Optical
Published Date: 09/10/2007

6. Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II

Author: Society of Photo-Optical Instrumentation Engineers - Editor: Bhanwar Singh

ISBN: 0819441635
ISBN13: 9780819441638
Binding: Paperback
List Price: $80.0
Publisher: Society of Photo Optical
Published Date: 12/10/2001

7. Challenges in Process Integration and Device Technology

Author: Bhanwar Singh - Author: Shinichiro Kimura - Author: Society of Photo-Optical Instrumentation Engineers

ISBN: 0819438421
ISBN13: 9780819438423
Binding: Paperback
List Price: $105.0
Publisher: Society of Photo Optical
Published Date: 08/18/2000

8. Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries

Author: Bhanwar Singh - Author: Angela Duparre - Author: Society of Photo-Optical Instrumentation Engineers

ISBN: 0819437441
ISBN13: 9780819437440
Binding: Paperback
List Price: $80.0
Publisher: Society of Photo Optical
Published Date: 11/02/2000

9. Metrology, Inspection, and Process Control for Microlithography Xiii: 15-18 March, 1999, Santa Clara, California

Author: Semiconductor Equipment and Materials International - Author: Society of Photo-Optical Instrumentation Engineers - Editor: Bhanwar Singh

ISBN: 0819431516
ISBN13: 9780819431516
Binding: Paperback
List Price: $160.0
Publisher: Society of Photo Optical
Published Date: 06/01/1999