Synopses & Reviews
Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.
Review
From the reviews: "This book results from a Japanese project aiming to predict the future development of SPM techniques and their potential applications out to the year 2020. ... The descriptions and historical backgrounds for each technique are adequately written ... . it will most likely find a use as a reference text and starting point for further reading." (N J Curson, Australian Physics, Vol. 44 (2), 2007)
Synopsis
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Table of Contents
Future Trend of Science and Technology in 21st Century.- Scanning Tunneling Microscope (STM).- Atomic Force Microscope (AFM).- Near Field Optical Microscope.- Scanning Capacitance Microscope.- Electrostatic Force Microscope.- Magnetic Force Microscope.- STM Radiation and Spectroscopy.- Scanning Atom Probe.- Chemical Discrimination of Atoms and Molecules.- Manipulation of Atoms and Molecules.- Multi-Probe SPM.- AFM Measurement in Solution.- High-Speed SPM.- Scanning Nonlinear Dielectric Microscope.- SPM Coupled with External Fields.- Spin Measurement.- Probe Technologies.- SPM Characterization of Magnetic Materials.- SPM Characterization of Semiconducting Materials.- SPM Characterization of LSI Devices.- SPM Characterization of Catalyst.- SPM Characterization of Biomaterials.- SPM Characterization of Organic Matter and High Polymer.- Theory of SPM.- Round-Table Talk on SPM Roadmap